Scan-In, Scan-Out ==>
scan design
<electronics> (Or "Scan-In, Scan-Out") A electronic circuit design
technique which aims to increase the controllability and observability of a
digital logic circuit by incorporating special "scan registers" into the circuit
so that they form a scan path.
Some of the more common types of scan design include the multiplexed register
designs and level-sensitive scan design (LSSD) used extensively by IBM. Boundary
scan can be used alone or in combination with either of the above techniques.
["Digital Systems Testing and Testable Design" by Abramovici, Breuer, and
Friedman, ISBN 0-7167-8179-4].
["Design of Testable Logic Circuits" by R.G. Bennetts, (Brunel/Southhampton
Universities), ISBN 0-201-14403-4].
(1995-02-23)
Nearby terms:
SCALLOP « SCAN « scan « scan design »
SCANDISK » Scan-EDF » scanf
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